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4 article(s) from Temmen, Matthias

Noise in NC-AFM measurements with significant tip–sample interaction

Jannis Lübbe,
Matthias Temmen,
Philipp Rahe and
Michael Reichling

Beilstein J. Nanotechnol. 2016, 7, 1885–1904, doi:10.3762/bjnano.7.181

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Figure 1: Schematic representation of functional elements of an NC-AFM described by transfer functions H_y. Qu...

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Figure 2: Model for signal and noise propagation in an NC-AFM, highlighting the tip–sample interaction, PLL d...

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Figure 3: Relations between the piezo position z_p (tip position for resting cantilever), the lower turning po...

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Figure 4: Determination of the tip–sample interaction parameter β_ts from the slope of a measured Δf(z_p) curve...

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Figure 5: Measured noise spectral density (solid lines) of (a, b) the frequency shift signal and (c, d) the a...

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Figure 6: Frequency shift noise spectral density d^Δ^f for the case of significant tip–sample interaction measu...

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Figure 7: (a, b) Frequency shift noise spectral density d^Δ^f and (c, d) topography noise spectral density [Graphic 32] wit...

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Figure 8: (a, b) Frequency shift noise spectral density d^Δ^f and (c, d) topography noise spectral density [Graphic 34] wit...

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Figure 9: (a) Block diagram of interlaced control loops as introduced in Figure 2 and (b) signal-flow graph to demons...

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Figure 10: (a) Calculated gain and (b) calculated step response of the amplitude control loop compared to (c) ...

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Figure 11: (a) Calculated gain and (b) calculated step response of the PLL compared to (c) the measured step r...

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Figure 12: (a, b) Frequency response and (c, d) step response of the distance control loop for a given tip–sam...

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Figure 13: Ratio δα = −α_ts,2/α_ts,1 as a function of the z-position and the amplitude. A Morse interaction usin...

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Full Research Paper

Published 01 Dec 2016

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Understanding interferometry for micro-cantilever displacement detection

Alexander von Schmidsfeld,
Tobias Nörenberg,
Matthias Temmen and
Michael Reichling

Beilstein J. Nanotechnol. 2016, 7, 841–851, doi:10.3762/bjnano.7.76

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Figure 1: Details of the NC-AFM measuring head in a front and side view showing the interferometric setup wit...

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Figure 2: Schematic representation of the interferometer setup, signal path and cavity parameters. Signal pow...

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Figure 3: Schematic representation of three common types of misalignment of fiber and cantilever; (a) lateral...

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Figure 4: Schematic representation of the interferometer signal P_sig as a function of the fiber–cantilever di...

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Figure 5: Signal power over distance measurements for three differently positioned cantilevers. Cantilever 1 ...

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Figure 6: Lateral interference patterns for cantilever 4 scanned by the fiber-positioning piezo for (a) Fabry...

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Figure 7: Interference patterns for cantilever 4 generated from the 3D intensity map data for (a,d) Fabry–Pér...

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Figure 8: Interferometer signal power P_sig of the main maximum (black) and a side maximum (gray) measured for...

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Figure 9: Displacement spectral density [Graphic 27] of the noise floor of the interferometer signal as a function of the...

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Published 10 Jun 2016

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Determining cantilever stiffness from thermal noise

Jannis Lübbe,
Matthias Temmen,
Philipp Rahe,
Angelika Kühnle and
Michael Reichling

Beilstein J. Nanotechnol. 2013, 4, 227–233, doi:10.3762/bjnano.4.23

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Figure 1: Displacement noise spectral density [Graphic 34] measured for the fundamental mode of cantilever V 4. Measureme...

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Figure 2: (a) Measured resonance curve (solid line) of the excited cantilever V 4 with a fit (dotted line) of ...

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Figure 3: Frequency shift noise spectral density [Graphic 23] measured for cantilever V 4 (A₀ = 16.8 nm, demodulator band...

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Published 28 Mar 2013

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Thermal noise limit for ultra-high vacuum noncontact atomic force microscopy

Jannis Lübbe,
Matthias Temmen,
Sebastian Rode,
Philipp Rahe,
Angelika Kühnle and
Michael Reichling

Beilstein J. Nanotechnol. 2013, 4, 32–44, doi:10.3762/bjnano.4.4

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Figure 1: Schematic representation of the signal path in an NC-AFM system based on optical beam deflection wi...

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Figure 2: Illustrative representation for the spectral density of the displacement of a cantilever excited to...

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Figure 3: Illustrative representation of noise properties for a cantilever with f₀ = 70 kHz, k = 2.5 N/m and Q...

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Figure 4: Illustrative representation of the noise spectral density for the total frequency-shift noise [Graphic 53] = [Graphic 32] f...

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Figure 5: Frequency response of the high-bandwidth preamplifier (bandwidth 3.1 MHz) and the low-bandwidth pre...

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Figure 6: Measured and modelled noise figures for system C. (a) Different levels of displacement noise spectr...

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Figure 7: (a) Measured (solid) and modelled (dashed) frequency-shift-noise spectral density [Graphic 56] using three diff...

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Figure 8: (a) RMS frequency-shift noise δf and (b) normalised RMS frequency-shift noise δγ in the limit of pu...

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Published 17 Jan 2013

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